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Article

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Title

Low-Power Programmable PRPG With Test Compression Capabilities

Authors

[ 1 ] Dziekanat Wydziału Elektroniki i Telekomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ 2 ] Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ 3 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Year of publication

2015

Published in

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Journal year: 2015 | Journal volume: vol. 23 | Journal number: no. 6

Article type

scientific article

Publication language

english

Keywords
EN
  • built-in self-test (bist)
  • low-power (lp) test
  • pseudorandom test pattern generators (prpgs)
  • test data volume compression
Pages (from - to)

1063 - 1076

DOI

10.1109/TVLSI.2014.2332465

Ministry points / journal

30

Impact Factor

1,245

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