On deploying scan chains for data storage in test compression environment
[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee
2013
scientific article
english
EN In this study the authors show how the interface between automatic test equipment (ATE) and on-chip decompression logic can be improved by a smart reuse of the scan chains. Storing the parent patterns of a modular decompression scheme in groups of scan chains avoids multiple loads from the ATE and thus reduces the test time. The presented algorithm for scan chain selection allows a flexible bandwidth management while preserving encoding efficiency and fault coverage.
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