Title
Logic BIST with capture-per-clock hybrid test points
Authors
[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee
Scientific discipline (Law 2.0)
Year of publication
2019
Article type
scientific article
Publication language
english
Keywords
EN
- design for testability
- embedded test
- logic built-in self-test (LBIST)
- scan-based testing
- test points
Pages (from - to)
1028 - 1041
Ministry points / journal
100
Ministry points / journal in years 2017-2021
100
Impact Factor
2,168
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