Title
Embedded deterministic test for low cost manufacturing
Authors
[ 1 ] Instytut Elektroniki i Telekomunikacji (IEt), Wydział Elektryczny, Politechnika Poznańska | [ P ] employee
Year of publication
2003
Published in
Article type
scientific article
Publication language
english
Abstract
EN You have probably heard that BIST takes too long and its fault coverage is low, and that deterministic test requires too many patterns. This article shows how on-chip compression and decompression techniques provide high fault coverage with low test times.
Pages (from - to)
58 - 66
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