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Former doctoral school student

All publications

1.

A Nonlinear Stream Cipher for Encryption of Test Patterns in Streaming Scan Networks / Janusz Rajski, Maciej Trawka, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // IEEE Transactions on Circuits and Systems I: Regular Papers - 2025, vol. 72, no. 2, p. 535-547

Scientific article 140
2.

On Near-Maximum-Length Galois Nonlinear Feedback Shift Registers / Janusz Rajski, Maciej Trawka, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2025, vol. 44, iss. 4, p. 1238-1249

Scientific article 100
3.

H₂B: Crypto hash functions based on hybrid ring generators / Janusz Rajski, Maciej Trawka, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2024, vol. 43, iss. 2, p. 442-455

Scientific article 100
4.

A Lightweight True Random Number Generator for Root of Trust Applications / Janusz Rajski, Maciej Trawka, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2023, vol. 42, iss. 9, p. 2815-2825

Scientific article 100
5.

X-masking for Deterministic In-System Tests / Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2023, vol. 42, iss. 11, p. 4260-4269

Scientific article 100

1.

Test Data Encryption with a New Stream Cipher / Janusz Rajski, Maciej Trawka, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // W: 2024 IEEE International Test Conference, ITC 2024, Proceedings: IEEE Computer Society, 2024 - p. 313-322

Chapter in monograph / paper 20 70
2.

Hybrid Ring Generators for In-System Test Applications / Janusz Rajski, Maciej Trawka, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // W: 2023 IEEE European Test Symposium (ETS). Proceedings: Institute of Electrical and Electronics Engineers, 2023 - p. 1-6

Chapter in monograph / paper 20
3.

DIST: Deterministic In-System Test with X-masking / Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // W: 2022 IEEE International Test Conference. ITC 2022. Proceedings: Institute of Electrical and Electronics Engineers Inc, 2022 - p. 20-27

Chapter in monograph / paper 20 70
4.

Hardware Root of Trust for SSN-based DFT Ecosystems / Janusz Rajski, Maciej Trawka, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // W: 2022 IEEE International Test Conference. ITC 2022. Proceedings: Institute of Electrical and Electronics Engineers Inc, 2022 - p. 450-454

Chapter in monograph / paper 20 70
5.

X-Masking for In-System Deterministic Test / Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // W: Proceedings of the IEEE European Test Symposium 2022: IEEE, 2022 - p. [1]-[6]

Chapter in monograph / paper 20

1.

On secure deterministic in-system test solutions / Bartosz Włodarczak (WIiT) / prom. Janusz Rajski, Jerzy Tyszer (WIiT), rev. Mehdi Tahoori, Adit D. Singh, Giorgio Di Natale - Poznań, Poland, 2024 - 150 s.

Dissertation before defense

1.

Universal compactor architecture for testing circuits / Jerzy Tyszer (WIiT), Yingdi Liu, Nilanjan Mukherjee, Janusz Rajski, Grzegorz Mrugalski, Bartosz Włodarczak (WIiT) // 11/Z/2023

Invention