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Article

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Title

Test Time Reduction in EDT Bandwidth Management for SoC Designs

Authors

[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Year of publication

2013

Published in

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Journal year: 2013 | Journal volume: vol. 32 | Journal number: no. 11

Article type

scientific article

Publication language

english

Pages (from - to)

1776 - 1786

DOI

10.1109/TCAD.2013.2263038

Ministry points / journal

25

Impact Factor

1,203

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