Title
Time and Area Optimized Testing of Automotive ICs
Authors
[ 1 ] Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ 2 ] Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ D ] phd student | [ P ] employee
Scientific discipline (Law 2.0)
Year of publication
2021
Article type
scientific article
Publication language
english
Keywords
EN
- embedded test
- functional safety
- logic built-inself test (LBIST)
- scan-based testing
- test application time
- testpoints
Pages (from - to)
76 - 88
Points of MNiSW / journal
100.0
Points of MNiSW / journal in years 2017-2021
100.0
Impact Factor
2.312 [List 2020]
System created by Poznań University of Technology
and Poznan Supercomputing and Networking Center
Log in through eKonto to add to SIS