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Article


Title

Time and Area Optimized Testing of Automotive ICs

Authors

[ 1 ] Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ 2 ] Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ D ] phd student | [ P ] employee

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2021

Published in

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Journal year: 2021 | Journal volume: vol. 29 | Journal number: no. 1

Article type

scientific article

Publication language

english

Keywords
EN
  • embedded test
  • functional safety
  • logic built-inself test (LBIST)
  • scan-based testing
  • test application time
  • testpoints
Pages (from - to)

76 - 88

DOI

10.1109/TVLSI.2020.3025138

URL

https://ieeexplore.ieee.org/

Points of MNiSW / journal

100.0

Points of MNiSW / journal in years 2017-2021

100.0

Impact Factor

2.312 [List 2020]