Time and Area Optimized Testing of Automotive ICs

Nilanjan Mukherjee; Daniel Tille; Mahendar Sapati; Yingdi Liu; Jeffrey Mayer; Sylwester Milewski; Elham Moghaddam; Janusz Rajski; Jędrzej Solecki; Jerzy Tyszer

doi:10.1109/TVLSI.2020.3025138

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Article

Title

Time and Area Optimized Testing of Automotive ICs

Authors

Nilanjan Mukherjee
Daniel Tille
Mahendar Sapati
Yingdi Liu
Jeffrey Mayer
Sylwester Milewski (WIiT) ^{[ 1 ][ D ]}
Elham Moghaddam
Janusz Rajski
Jędrzej Solecki
Jerzy Tyszer (WIiT) ^{[ 2 ][ 2.3 ][ P ]}

^{[ 1 ]} Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | ^{[ 2 ]} Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | ^{[ D ]} phd student | ^{[ P ]} employee

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2021

Published in

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Journal year: 2021 | Journal volume: vol. 29 | Journal number: no. 1

Article type

scientific article

Publication language

english

Keywords

EN

embedded test
functional safety
logic built-inself test (LBIST)
scan-based testing
test application time
testpoints

Pages (from - to)

76 - 88

DOI

10.1109/TVLSI.2020.3025138

URL

https://ieeexplore.ieee.org/

Points of MNiSW / journal

100.0

Points of MNiSW / journal in years 2017-2021

100.0

Impact Factor

2.312 [List 2020]

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