Title
Test Time and Area Optimized BrST Scheme for Automotive ICs
Authors
[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee
Scientific discipline (Law 2.0)
Year of publication
2019
Chapter type
chapter in monograph / paper
Publication language
english
Keywords
EN
- built-in self-test
- embedded-test
- functional safety
- scan-based testing
- test application time
- test points
Ministry points / chapter
20
Ministry points / conference (CORE)
70
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