1.

A new static compaction of deterministic test sets / Stephan Eggersglüß, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer (WIiT) // IEEE Transactions on Very Large Scale Integration (VLSI) Systems - 2023, vol. 31, iss. 4, p. 411-420

Scientific article 100 2,8

2.

Autonomous Scan Patterns for Laser Voltage Imaging / Jerzy Tyszer (WIiT), Wu-Tung Cheng, Sylwester Milewski (WIiT), Grzegorz Mrugalski, Janusz Rajski, Maciej Trawka // IEEE Transactions on Emerging Topics in Computing - 2021, vol. 9, no. 2, p. 680-691

Scientific article 140 6,595

3.

On Reduction of Deterministic Test Pattern Sets / Stephan Eggersglüß, Sylwester Milewski (WIiT), Janusz Rajski, Jerzy Tyszer (WIiT) // W: Proceedings of the IEEE International Test Conference 2021: IEEE, 2021 - p. 260-267

Chapter in monograph / paper 20 70

4.

Time and Area Optimized Testing of Automotive ICs / Nilanjan Mukherjee, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski (WIiT), Elham Moghaddam, Janusz Rajski, Jędrzej Solecki, Jerzy Tyszer (WIiT) // IEEE Transactions on Very Large Scale Integration (VLSI) Systems - 2021, vol. 29, no. 1, p. 76-88

Scientific article 100 2,775

5.

X-Tolerant Compactor maXpress for In-System Test Applications with Observation Scan / Yingdi Liu, Sylwester Milewski (WIiT), Grzegorz Mrugalski, Nilanjan Mukherje, Janusz Rajski, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // IEEE Transactions on Very Large Scale Integration (VLSI) Systems - 2021, vol. 29, no. 8, p. 1553-1566

Scientific article 100 2,775

6.

Low Cost Hypercompression of Test Data / Yu Huang, Sylwester Milewski (WIiT), Janusz Rajski, Jerzy Tyszer (WIiT), Chen Wang // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2020, vol. 39, no. 10, p. 2964-2975

Scientific article 100 2,807

7.

X-Tolerant Tunable Compactor for In-System Test / Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherje, Janusz Rajski, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // W: IEEE International Test Conference (ITC) 2020: IEEE, 2020

Chapter in monograph / paper 20 70

8.

Test Time and Area Optimized BrST Scheme for Automotive ICs / Nilanjan Mukherjee, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham Moghaddam, Janusz Rajski, Jędrzej Solecki, Jerzy Tyszer (WEiT) // W: IEEE International Test Conference (ITC 2019): IEEE, 2019

Chapter in monograph / paper 20 70

9.

Hypercompression of test patterns / Yu Huang, Sylwester Milewski (WEiT), Janusz Rajski, Jerzy Tyszer (WEiT), Chen Wang // W: 2018 IEEE International Test Conference (ITC) - New York, USA : IEEE, 2018

Chapter in monograph / paper 20 70

10.

Full-Scan LBIST with Capture-per-Cycle Hybrid Test Points / Sylwester Milewski (PP), Nilanjan Mukherjee, Janusz Rajski, Jędrzej Solecki, Jerzy Tyszer (WEiT), Justyna Zawada (WEiT) // W: 2017 IEEE International Test Conference (ITC) - New York, NY, USA : IEEE, 2017 - p. 1-9

Chapter in monograph / paper 20 70

11.

Low Power Test Compression with Programmable Broadcast-Based Control / Sylwester Milewski, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer (WEiT) // W: IEEE 23rd Asian Test Symposium (ATS), 2014, Hangzhou, 16-19 Nov. 2014: IEEE, 2014 - p. 174-179

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